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Stephen Longofono
Stephen Longofono
University of Pittsburgh, University of Kansas
Verified email at pitt.edu
Title
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Cited by
Year
A novel transverse read technique for domain-wall “racetrack” memories
K Roxy, S Ollivier, A Hoque, S Longofono, AK Jones, S Bhanja
IEEE Transactions on Nanotechnology 19, 648-652, 2020
202020
Brain-inspired Cognition in Next-generation Racetrack Memories
AA Khan, S Ollivier, S Longofono, G Hempel, J Castrillon, AK Jones
ACM Transactions on Embedded Computing Systems 21 (6), 1-28, 2022
102022
Pirm: Processing in racetrack memories
S Ollivier, S Longofono, P Dutta, J Hu, S Bhanja, AK Jones
arXiv preprint arXiv:2108.01202, 2021
92021
CORUSCANT: Fast efficient processing-in-racetrack memories
S Ollivier, S Longofono, P Dutta, J Hu, S Bhanja, AK Jones
2022 55th IEEE/ACM International Symposium on Microarchitecture (MICRO), 784-798, 2022
82022
Toward comprehensive shifting fault tolerance for domain-wall memories with PIETT
S Ollivier, S Longofono, P Dutta, J Hu, S Bhanja, AK Jones
IEEE Transactions on Computers 72 (4), 1095-1109, 2022
62022
Predicting and mitigating single-event upsets in DRAM using HOTH
S Longofono, D Kline Jr, R Melhem, AK Jones
Microelectronics Reliability 117, 114024, 2021
62021
A CASTLE With TOWERs for Reliable, Secure Phase-Change Memory
S Longofono, D Kline, R Melhem, AK Jones
IEEE Transactions on Computers 70 (9), 1311-1324, 2020
62020
Virtual coset coding for encrypted non-volatile memories with multi-level cells
S Longofono, SM Seyedzadeh, AK Jones
2022 IEEE International Symposium on High-Performance Computer Architecture …, 2022
52022
PREMSim: A resilience framework for modeling traditional and emerging memory reliability
D Kline, S Longofono, S Ollivier, E Higgins, R Melhem, AK Jones
2019 IEEE 27th International Symposium on Modeling, Analysis, and Simulation …, 2019
32019
Pinning fault mode modeling for DWM shifting
K Roxy, S Longofono, S Olliver, S Bhanja, AK Jones
IEEE Transactions on Circuits and Systems II: Express Briefs 69 (7), 3319-3323, 2022
22022
Toward Secure, Reliable, and Energy Efficient Phase-change Main Memory with MACE
S Longofono, D Kline, R Melhem, AK Jones
2019 Tenth International Green and Sustainable Computing Conference (IGSC), 1-8, 2019
22019
Predicting Single Event Effects in DRAM
D Kline, S Longofono, R Melhem, AK Jones
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and …, 2019
12019
Tuning Memory Fault Tolerance on the Edge
AK Jones, S Longofono, S Ollivier, D Kline, J Zhang, R Melhem
Proceedings of the 2021 on Great Lakes Symposium on VLSI, 421-424, 2021
2021
Secure, Reliable, and Energy-efficient Phase Change Main Memory
S Longofono
University of Pittsburgh, 2021
2021
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