Nishad K Patil
Nishad K Patil
University of Maryland College Park
Dirección de correo verificada de intel.com
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Precursor parameter identification for insulated gate bipolar transistor (IGBT) prognostics
N Patil, J Celaya, D Das, K Goebel, M Pecht
IEEE Transactions on Reliability 58 (2), 271-276, 2009
2302009
Identification of failure precursor parameters for insulated gate bipolar transistors (IGBTs)
N Patil, D Das, K Goebel, M Pecht
2008 International conference on prognostics and health management, 1-5, 2008
1092008
A prognostic approach for non-punch through and field stop IGBTs
N Patil, D Das, M Pecht
Microelectronics Reliability 52 (3), 482-488, 2012
882012
Towards accelerated aging methodologies and health management of power MOSFETs (technical brief)
JR Celaya, N Patil, S Saha, P Wysocki, K Goebel
Annual Conference of the PHM Society 1 (1), 2009
512009
Design, modelling and simulation of vibratory micromachined gyroscopes
S Mohite, N Patil, R Pratap
Journal of Physics: Conference Series 34 (1), 125, 2006
492006
Anomaly detection for IGBTs using Mahalanobis distance
N Patil, D Das, M Pecht
Microelectronics Reliability 55 (7), 1054-1059, 2015
292015
A fusion approach to IGBT power module prognostics
N Patil, D Das, C Yin, H Lu, C Bailey, M Pecht
EuroSimE 2009-10th International Conference on Thermal, Mechanical and Multi …, 2009
292009
Failure precursors for insulated gate bipolar transistors (IGBTs)
N Patil, D Das, K Goebel, M Pecht
IET Digital Library, 2008
202008
Long term storage reliability of antifuse field programmable gate arrays
N Patil, D Das, E Scanff, M Pecht
Microelectronics Reliability 53 (12), 2052-2056, 2013
162013
Anomaly detection of non punch through insulated gate bipolar transistors (IGBT) by robust covariance estimation techniques
N Patil, S Menon, D Das, M Pecht
2010 2nd International Conference on Reliability, Safety and Hazard-Risk …, 2010
142010
Applications of health monitoring to wind turbines
MH Azarian, RSR Kumar, N Patil, A Shrivastava, MG Pecht
Proceedings of Condition Monitoring and Diagnostics Engineering Management …, 2011
122011
Mahalanobis Distance Approach for Insulated Gate Bipolar Transistors Diagnostics
N Patil, D Das, M Pecht
New World Situation: New Directions in Concurrent Engineering, 643-651, 2010
62010
Design and characterization of in-plane MEMS yaw rate sensor
KP Venkatesh, N Patil, AK Pandey, R Pratap
Sadhana 34 (4), 633, 2009
42009
Prognostics of insulated gate bipolar transistors
NK Patil
12011
Evaluation of robust covariance estimation techniques for anomaly detection of insulated gate bipolar transistors (IGBT)
N Patil, S Menon, D Das, M Pecht
Smart Materials, Adaptive Structures and Intelligent Systems 44168, 769-773, 2010
12010
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