| Polyharmonic distortion modeling DE Root IEEE microwave magazine 7 (3), 44-57, 2006 | 480 | 2006 |
| Technology independent large signal non quasi-static FET models by direct construction from automatically characterized device data DE Root, S Fan, J Meyer 1991 21st European Microwave Conference 2, 927-932, 1991 | 264 | 1991 |
| Broad-band poly-harmonic distortion (PHD) behavioral models from fast automated simulations and large-signal vectorial network measurements DE Root, J Verspecht, D Sharrit, J Wood, A Cognata IEEE Transactions on Microwave Theory and Techniques 53 (11), 3656-3664, 2005 | 257 | 2005 |
| X-parameters: characterization, modeling, and design of nonlinear RF and microwave components DE Root, J Verspecht, J Horn, M Marcu Cambridge University Press, 2013 | 192 | 2013 |
| Fundamentals of nonlinear behavioral modeling for RF and microwave design J Wood, DE Root (No Title), 2005 | 132 | 2005 |
| Future device modeling trends DE Root IEEE Microwave Magazine 13 (7), 45-59, 2012 | 117 | 2012 |
| A behavioral modeling approach to nonlinear model-order reduction for RF/microwave ICs and systems J Wood, DE Root, NB Tufillaro IEEE Transactions on Microwave Theory and Techniques 52 (9), 2274-2284, 2004 | 113 | 2004 |
| Load-pull+ NVNA= enhanced X-parameters for PA designs with high mismatch and technology-independent large-signal device models G Simpson, J Horn, D Gunyan, DE Root 2008 72nd ARFTG microwave measurement symposium, 88-91, 2008 | 111 | 2008 |
| Nonlinear transistor model parameter extraction techniques M Rudolph, C Fager, DE Root Cambridge University Press, 2011 | 102 | 2011 |
| Measurement-based system for modeling and simulation of active semiconductor devices over an extended operating frequency range S Fan, DE Root, JW Meyer US Patent 5,467,291, 1995 | 99 | 1995 |
| Bias-dependent linear scalable millimeter-wave FET model J Wood, DE Root IEEE Transactions on Microwave Theory and Techniques 48 (12), 2352-2360, 2000 | 98 | 2000 |
| New trends for the nonlinear measurement and modeling of high-power RF transistors and amplifiers with memory effects P Roblin, DE Root, J Verspecht, Y Ko, JP Teyssier IEEE Transactions on Microwave Theory and Techniques 60 (6), 1964-1978, 2012 | 93 | 2012 |
| Principles of nonlinear active device modeling for circuit simulation DE Root, B Hughes 32nd ARFTG Conference Digest 14, 1-24, 1988 | 87 | 1988 |
| Dynamic FET model-DynaFET-for GaN transistors from NVNA active source injection measurements J Xu, R Jones, SA Harris, T Nielsen, DE Root 2014 IEEE MTT-S International Microwave Symposium (IMS2014), 1-3, 2014 | 81 | 2014 |
| Extension of X-parameters to include long-term dynamic memory effects J Verspecht, J Horn, L Betts, D Gunyan, R Pollard, C Gillease, DE Root 2009 IEEE MTT-S International Microwave Symposium Digest, 741-744, 2009 | 76 | 2009 |
| Large-signal HBT model with improved collector transit time formulation for GaAs and InP technologies M Iwamoto, DE Root, JB Scott, A Cognata, PM Asbeck, B Hughes, ... IEEE MTT-S International Microwave Symposium Digest, 2003 2, 635-638, 2003 | 74 | 2003 |
| Multi-tone, multi-port, and dynamic memory enhancements to PHD nonlinear behavioral models from large-signal measurements and simulations J Verspecht, D Gunyan, J Horn, J Xu, A Cognata, DE Root 2007 IEEE/MTT-S International Microwave Symposium, 969-972, 2007 | 72 | 2007 |
| Technology-independent large-signal FET models: A measurement-based approach to active device modeling D Root 15 ARMMS Conf., Bath, 1991 | 71 | 1991 |
| GaN device modeling with X-parameters J Horn, DE Root, G Simpson 2010 IEEE Compound Semiconductor Integrated Circuit Symposium (CSICS), 1-4, 2010 | 69 | 2010 |
| X-parameter measurement and simulation of a GSM handset amplifier JM Horn, J Verspecht, D Gunyan, L Betts, DE Root, J Eriksson 2008 European Microwave Integrated Circuit Conference, 135-138, 2008 | 63 | 2008 |
Jan VerspechtResearch Engineer, Keysight Technologies, Inc.Dirección de correo verificada de janverspecht.com
