| Approaches to calculate the dielectric function of ZnO around the band gap E Agocs, B Fodor, B Pollakowski, B Beckhoff, A Nutsch, M Jank, P Petrik Thin Solid Films 571, 684-688, 2014 | 30 | 2014 |
| Effective medium approximation of ellipsometric response from random surface roughness simulated by finite-element method B Fodor, P Kozma, S Burger, M Fried, P Petrik Thin Solid Films 617, 20-24, 2016 | 29 | 2016 |
| Near-infrared optical properties and proposed phase-change usefulness of transition metal disulfides A Singh, Y Li, B Fodor, L Makai, J Zhou, H Xu, A Akey, J Li, R Jaramillo Applied Physics Letters 115 (16), 2019 | 28 | 2019 |
| Porosity and thickness characterization of porous Si and oxidized porous Si layers–An ultraviolet–visible–mid infrared ellipsometry study B Fodor, E Agocs, B Bardet, T Defforge, F Cayrel, D Alquier, M Fried, ... microporous and mesoporous materials 227, 112-120, 2016 | 25 | 2016 |
| Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires B Fodor, T Defforge, E Agócs, M Fried, G Gautier, P Petrik Applied Surface Science 421, 397-404, 2017 | 23 | 2017 |
| Investigation of thin polymer layers for biosensor applications A Saftics, E Agócs, B Fodor, D Patkó, P Petrik, K Kolari, T Aalto, P Fürjes, ... Applied surface science 281, 66-72, 2013 | 21 | 2013 |
| Fourier ellipsometry–an ellipsometric approach to Fourier scatterometry P Petrik, N Kumar, M Fried, B Fodor, G Juhász, SF Pereira, S Burger, ... Journal of the European Optical Society-Rapid publications 10, 2015 | 13 | 2015 |
| Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry P Petrik, T Gumprecht, A Nutsch, G Roeder, M Lemberger, G Juhasz, ... Thin Solid Films 541, 131-135, 2013 | 12 | 2013 |
| Optical characterization of macro-, micro-and nanostructures using polarized light P Petrik, N Kumar, G Juhasz, C Major, B Fodor, E Agocs, T Lohner, ... Journal of Physics: Conference Series 558 (1), 012008, 2014 | 11 | 2014 |
| Optical Models for the Characterization of Silica Nanosphere Monolayers Prepared by the Langmuir− Blodgett Method Using Ellipsometry in the Quasistatic Regime P Kozma, B Fodor, A Deak, P Petrik Langmuir 26 (20), 16122-16128, 2010 | 11 | 2010 |
| Grating coupled optical waveguide interferometry combined with in situ spectroscopic ellipsometry to monitor surface processes in aqueous solutions E Agocs, P Kozma, J Nador, A Hamori, M Janosov, B Kalas, S Kurunczi, ... Applied Surface Science 421, 289-294, 2017 | 9 | 2017 |
| Resolving lateral and vertical structures by ellipsometry using wavelength range scan P Petrik, E Agocs, J Volk, I Lukacs, B Fodor, P Kozma, T Lohner, S Oh, ... Thin Solid Films 571, 579-583, 2014 | 9 | 2014 |
| Optical and structural characterization of Ge clusters embedded in ZrO2 E Agocs, Z Zolnai, AK Rossall, JA van den Berg, B Fodor, D Lehninger, ... Applied Surface Science 421, 283-288, 2017 | 8 | 2017 |
| Optical polymers with tunable refractive index for nanoimprint technologies J Landwehr, R Fader, M Rumler, M Rommel, AJ Bauer, L Frey, B Simon, ... Nanotechnology 25 (50), 505301, 2014 | 8 | 2014 |
| Ellipsometric study of crystalline silicon hydrogenated by plasma immersion ion implantation A Szekeres, S Alexandrova, P Petrik, B Fodor, S Bakalova Applied surface science 281, 105-108, 2013 | 7 | 2013 |
| Ammonia-vapour-induced two-layer transformation of mesoporous silica coatings on various substrates L Kócs, B Tegze, E Albert, C Major, A Szalai, B Fodor, P Basa, G Sáfrán, ... Vacuum 192, 110415, 2021 | 6 | 2021 |
| Optimized plasma-polymerized fluoropolymer mask for local porous silicon formation B Lu, T Defforge, B Fodor, B Morillon, D Alquier, G Gautier Journal of Applied Physics 119 (21), 2016 | 6 | 2016 |
| Photoinduced processes of adsorbed and associated dye molecules in mesoporous titania coatings B Tegze, E Albert, B Fodor, G Sáfrán, Z Hórvölgyi Dyes and Pigments 167, 109-119, 2019 | 5 | 2019 |
| Methods for optical modeling and cross-checking in ellipsometry and scatterometry P Petrik, B Fodor, E Agocs, P Kozma, J Nador, N Kumar, J Endres, ... Modeling Aspects in Optical Metrology V 9526, 179-189, 2015 | 5 | 2015 |
| Composite polymeric-inorganic waveguide fabricated by injection molding for biosensing applications F Dortu, D Bernier, I Cestier, D Vandormael, C Emmerechts, LE Fissi, ... 2014 16th International Conference on Transparent Optical Networks (ICTON), 1-4, 2014 | 5 | 2014 |
Peter PetrikEK MFA, University of DebrecenDirección de correo verificada de mfa.kfki.hu
