| Design of regular layouts to improve predictability C Menezes, C Meinhardt, R Reis, R Tavares 2006 International Caribbean Conference on Devices, Circuits and Systems, 67-72, 2006 | 91 | 2006 |
| Predictive evaluation of electrical characteristics of sub-22 nm FinFET technologies under device geometry variations C Meinhardt, AL Zimpeck, RAL Reis Microelectronics Reliability 54 (9-10), 2319-2324, 2014 | 64 | 2014 |
| A low-cost solution for deploying processor cores in harsh environments M Violante, C Meinhardt, R Reis, MS Reorda IEEE Transactions on Industrial Electronics 58 (7), 2617-2626, 2011 | 48 | 2011 |
| A low-cost SEE mitigation solution for soft-processors embedded in systems on pogrammable chips MS Reorda, M Violante, C Meinhardt, R Reis 2009 Design, Automation & Test in Europe Conference & Exhibition, 352-357, 2009 | 36 | 2009 |
| Logic synthesis meets machine learning: Trading exactness for generalization S Rai, WL Neto, Y Miyasaka, X Zhang, M Yu, Q Yi, M Fujita, GB Manske, ... 2021 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2021 | 35 | 2021 |
| Impact of PVT variability on 20 nm FinFET standard cells AL Zimpeck, C Meinhardt, RAL Reis Microelectronics Reliability 55 (9-10), 1379-1383, 2015 | 31 | 2015 |
| Impact of different transistor arrangements on gate variability AL Zimpeck, C Meinhardt, L Artola, G Hubert, FL Kastensmidt, RAL Reis Microelectronics Reliability 88, 111-115, 2018 | 29 | 2018 |
| Impact of gate workfunction fluctuation on FinFET standard cells C Meinhardt, AL Zimpeck, R Reis 2014 21st IEEE International Conference on Electronics, Circuits and Systems …, 2014 | 25 | 2014 |
| FinFET basic cells evaluation for regular layouts C Meinhardt, R Reis 2013 IEEE 4th Latin American Symposium on Circuits and Systems (LASCAS), 1-4, 2013 | 25 | 2013 |
| Evaluation of variability using schmitt trigger on full adders layout LB Moraes, AL Zimpeck, C Meinhardt, R Reis Microelectronics reliability 88, 116-121, 2018 | 24 | 2018 |
| Evaluation of radiation-induced soft error in majority voters designed in 7 nm FinFET technology YQ De Aguiar, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, RAL Reis Microelectronics Reliability 76, 660-664, 2017 | 23 | 2017 |
| Analysis of 6 T SRAM cell in sub-45 nm CMOS and FinFET technologies RB Almeida, CM Marques, PF Butzen, FRG Silva, RAL Reis, C Meinhardt Microelectronics Reliability 88, 196-202, 2018 | 22 | 2018 |
| FinFET cells with different transistor sizing techniques against PVT variations AL Zimpeck, C Meinhardt, G Posser, R Reis 2016 IEEE International Symposium on Circuits and Systems (ISCAS), 45-48, 2016 | 21 | 2016 |
| Fast logic optimization using decision trees BA De Abreu, A Berndt, IS Campos, C Meinhardt, JT Carvalho, M Grellert, ... 2021 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2021 | 17 | 2021 |
| Radiation sensitivity of XOR topologies in multigate technologies under voltage variability YQ de Aguiar, C Meinhardt, RAL Reis 2017 IEEE 8th Latin American Symposium on Circuits & Systems (LASCAS), 1-4, 2017 | 17 | 2017 |
| Pros and cons of schmitt trigger inverters to mitigate pvt variability on full adders SP Toledo, AL Zimpeck, R Reis, C Meinhardt 2018 IEEE International Symposium on Circuits and Systems (ISCAS), 1-5, 2018 | 15 | 2018 |
| PVT variability analysis of FinFET and CMOS XOR circuits at 16nm FGRG da Silva, PF Butzen, C Meinhardt 2016 IEEE International Conference on Electronics, Circuits and Systems …, 2016 | 15 | 2016 |
| Circuit-level hardening techniques to mitigate soft errors in finfet logic gates AL Zimpeck, L Artola, G Hubert, C Meinhardt, FL Kastensmidt, R Reis 2019 19th European Conference on Radiation and Its Effects on Components and …, 2019 | 13 | 2019 |
| Evaluating the impact of environment and physical variability on the ION current of 20nm FinFET devices AL Zimpeck, C Meinhardt, R Reis 2014 24th International Workshop on Power and Timing Modeling, Optimization …, 2014 | 13 | 2014 |
| Multi-level design influences on robustness evaluation of 7nm FinFET technology LH Brendler, AL Zimpeck, C Meinhardt, R Reis IEEE Transactions on Circuits and Systems I: Regular Papers 67 (2), 553-564, 2019 | 11 | 2019 |
Ricardo Augusto da Luz ReisUFRGSVerified email at inf.ufrgs.br
