An adjustable-stiffness MEMS force sensor: Design, characterization, and control M Maroufi, H Alemansour, MB Coskun, SOR Moheimani
Mechatronics 56, 198-210, 2018
38 2018 Effect of size on the chaotic behavior of nano resonators H Alemansour, EM Miandoab, HN Pishkenari
Communications in Nonlinear Science and Numerical Simulation 44, 495-505, 2017
36 2017 Control of an Active AFM Cantilever With Differential Sensing ConfigurationMB Coskun, H Alemansour, AG Fowler, M Maroufi, SOR Moheimani
IEEE Transactions on Control Systems Technology 27 (5), 2271-2278, 2018
31 2018 A high dynamic range closed-loop stiffness-adjustable MEMS force sensor M Maroufi, H Alemansour, SOR Moheimani
Journal of Microelectromechanical Systems 29 (3), 397-407, 2020
13 2020 Controlled removal of hydrogen atoms from H-terminated silicon surfaces H Alemansour, SO Moheimani, JHG Owen, JN Randall, E Fuchs
Journal of Vacuum Science & Technology B 38 (4), 2020
12 2020 High signal-to-noise ratio differential conductance spectroscopy H Alemansour, SO Moheimani, JHG Owen, JN Randall, E Fuchs
Journal of Vacuum Science & Technology B 39 (1), 2021
9 2021 A closed-loop MEMS force sensor with adjustable stiffness M Maroufi, H Alemansour, SOR Moheimani
2017 IEEE Conference on Control Technology and Applications (CCTA), 438-443, 2017
8 2017 Ultrafast method for scanning tunneling spectroscopy H Alemansour, SO Moheimani, JHG Owen, JN Randall, E Fuchs
Journal of Vacuum Science & Technology B 39 (4), 2021
7 2021 A new approach to removing H atoms in hydrogen depassivation lithography SOR Moheimani, H Alemansour
Novel Patterning Technologies for Semiconductors, MEMS/NEMS and MOEMS 2020 …, 2020
5 2020 A Highly Integrated AFM-SEM Correlative Analysis Platform A Alipour, KT Arat, H Alemansour, L Montes, J Gardiner, J Diederichs, ...
Microscopy Today 31 (6), 17-22, 2023
2 2023 A feedback controlled MEMS probe scanner for on-chip AFM H Alemansour, M Maroufi, A Alipour, SOR Moheimani
IFAC-PapersOnLine 52 (15), 295-300, 2019
2 2019 Design and Characterization of a MEMS Probe Scanner for On-chip Atomic Force Microscopy M Maroufi, A Alipour, H Alemansour, SOR Moheimani
2019 International Conference on Manipulation, Automation and Robotics at …, 2019
2 2019 Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software SOR Moheimani, H Alemansour
Univ. of Texas, Austin, TX (United States), 2023
1 2023 Biomechanics characterization of autonomic and somatic nerves by high dynamic closed-loop MEMS force sensing MA González-González, H Alemansour, M Maroufi, MB Coskun, D Lloyd, ...
bioRxiv, 2023
1 2023 Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software SOR Moheimani, H Alemansour
US Patent 11,143,671, 2021
1 2021 Model-Based Control of the Scanning Tunneling Microscope: Enabling New Modes of Imaging, Spectroscopy, and Lithography H Alemansour, SOR Moheimani
IEEE Control Systems Magazine 44 (1), 46-66, 2024
2024 A New Correlative Microscopy Platform Integrating AFM with in situ SEM K Arat, H Alemansour, A Aman, L Montes, J Gardiner, CH Schwalb, ...
Microscopy and Microanalysis 29 (Supplement_1), 1944-1945, 2023
2023 Methods and devices configured to operated scanning tunneling microscopes using out-of-bandwidth frequency components added to bias voltage and related software SOR Moheimani, H Alemansour
US Patent 11,650,222, 2023
2023 Development of Probe-based Devices and Methods for Applications in Micro/Nano Characterization and Fabrication H Alemansour
2022