Seguir
zhichao you
zhichao you
Dirección de correo verificada de sjtu.edu.cn
Título
Citado por
Citado por
Año
Machine vision based condition monitoring and fault diagnosis of machine tools using information from machined surface texture: A review
Y Liu, L Guo, H Gao, Z You, Y Ye, B Zhang
Mechanical Systems and Signal Processing 164, 108068, 2022
1042022
YOLO-SLAM: A semantic SLAM system towards dynamic environment with geometric constraint
W Wu, L Guo, H Gao, Z You, Y Liu, Z Chen
Neural Computing and Applications, 1-16, 2022
832022
On-line milling cutter wear monitoring in a wide field-of-view camera
Z You, H Gao, L Guo, Y Liu, J Li
Wear 460, 203479, 2020
422020
A data-flow oriented deep ensemble learning method for real-time surface defect inspection
Y Liu, H Gao, L Guo, A Qin, C Cai, Z You
IEEE Transactions on Instrumentation and Measurement 69 (7), 4681-4691, 2019
322019
A fault pulse extraction and feature enhancement method for bearing fault diagnosis
Z Chen, L Guo, H Gao, Y Yu, W Wu, Z You, X Dong
Measurement 182, 109718, 2021
302021
FedCAE: a new federated learning framework for edge-cloud collaboration based machine fault diagnosis
Y Yu, L Guo, H Gao, Y He, Z You, A Duan
IEEE Transactions on Industrial Electronics, 2023
282023
Machine vision based adaptive online condition monitoring for milling cutter under spindle rotation
Z You, H Gao, L Guo, Y Liu, J Li, C Li
Mechanical Systems and Signal Processing 171, 108904, 2022
282022
Research on tool wear morphology and mechanism during turning nickel-based alloy GH4169 with PVD-TiAlN coated carbide tool
J Liang, H Gao, S Xiang, L Chen, Z You, Y Lei
Wear 508, 204468, 2022
242022
Research on automatic monitoring method of face milling cutter wear based on dynamic image sequence
A Qin, L Guo, Z You, H Gao, X Wu, S Xiang
The International Journal of Advanced Manufacturing Technology 110, 3365-3376, 2020
212020
Multiple Activation Functions and Data Augmentation-Based Lightweight Network for In Situ Tool Condition Monitoring
Z You, H Gao, S Li, L Guo, Y Liu, J Li
IEEE Transactions on Industrial Electronics 69 (12), 13656-13664, 2022
172022
Force measurement and support integrated device in hypersonic wind tunnel
S Li, Z You, H Gao, Q Wang, G Wu, G Ma
IEEE Transactions on Instrumentation and Measurement 71, 1-9, 2021
162021
Gcforest-based fault diagnosis method for rolling bearing
Q Liu, H Gao, Z You, H Song, L Zhang
2018 Prognostics and System Health Management Conference (PHM-Chongqing …, 2018
142018
Adaptive detection of tool-workpiece contact for nanoscale tool setting based on multi-scale decomposition of force signal
Z You, Y Meng, D Li, Z Zhang, M Ren, X Zhang, LM Zhu
Mechanical Systems and Signal Processing 208, 111000, 2024
32024
Vision-based defect measurement of drilled CFRP composites using double-light imaging
C Li, Y Lei, Z You, L Guo, E Zio, H Gao
IEEE Transactions on Instrumentation and Measurement, 2023
32023
A novel evaluation metric based on dispersion of wear distance for in situ tool condition monitoring
Z You, S Li, C Li, H Gao, L Guo, Y Liu
IEEE Transactions on Instrumentation and Measurement 72, 1-10, 2022
32022
A Transfer Learning Based Method for Incipient Fault Detection
C Li, L Guo, H Gao, J Yang, X Dong, Z You
2021 4th IEEE International Conference on Industrial Cyber-Physical Systems …, 2021
32021
Normalized Variational Auto-Encoder With the Adaptive Activation Function for Tool Setting in Ultraprecision Turning
Z You, Y Meng, Z Zhang, M Ren, X Zhang, L Zhu
IEEE Transactions on Industrial Informatics, 2023
22023
An improved UNet model based on adaptive activation function and squeeze-and-excitation module for milling tool wear segmentation
C Cai, Z You, C Li, Y Sun, S Li, H Gao
2023 Prognostics and Health Management Conference (PHM), 272-277, 2023
12023
Tool Wear Prediction Based on Residual Connection and Temporal Networks
Z Li, X Lei, Z You, T Huang, K Guo, D Li, H Liu
Machines 12 (5), 306, 2024
2024
SE-U-Lite: Milling Tool Wear Segmentation based on Lightweight U-Net Model with Squeeze-and-Excitation Module
P Zhao, Z Li, Z You, Z Chen, T Huang, K Guo, D Li
IEEE Transactions on Instrumentation and Measurement, 2024
2024
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20