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Andres F. Gomez
Andres F. Gomez
Electronics Engineer, Ph.D.
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Year
Early selection of critical paths for reliable NBTI aging-delay monitoring
AF Gomez, V Champac
IEEE Transactions on very large scale integration (VLSI) systems 24 (7 …, 2016
172016
Effectiveness of a hardware-based approach to detect resistive-open defects in SRAM cells under process variations
AF Gomez, F Lavratti, G Medeiros, M Sartori, LB Poehls, V Champac, ...
Microelectronics Reliability 67, 150-158, 2016
162016
Selection of critical paths for reliable frequency scaling under BTI-aging considering workload uncertainty and process variations effects
AF Gomez, V Champac
ACM Transactions on Design Automation of Electronic Systems (TODAES) 23 (3 …, 2018
102018
EU27 and USA institutions in the digital ecosystem: Proposal for a digital presence measurement index
JM Ponzoa, A Gómez, JM Mas
Journal of Business Research 154, 113354, 2023
92023
A new sizing approach for lifetime improvement of nanoscale digital circuits due to BTI aging
A Gomez, V Champac
2015 IFIP/IEEE International Conference on Very Large Scale Integration …, 2015
92015
An efficient metric-guided gate sizing methodology for guardband reduction under process variations and aging effects
A Gomez, V Champac
Journal of Electronic Testing 35, 87-100, 2019
62019
Effective selection of favorable gates in BTI-critical paths to enhance circuit reliability
A Gomez, V Champac
2015 16th Latin-American Test Symposium (LATS), 1-6, 2015
62015
Robust detection of bridge defects in STT-MRAM cells under process variations
AF Gomez, F Forero, K Roy, V Champac
2018 IFIP/IEEE International Conference on Very Large Scale Integration …, 2018
42018
An early prediction methodology for aging sensor insertion to assure safe circuit operation due to NBTI aging
A Gomez, L Poehls, F Vargas, V Champac
2015 IEEE 33rd VLSI Test Symposium (VTS), 1-6, 2015
42015
Analysis of bridge defects in STT-MRAM cells under process variations and a robust DFT technique for their detection
V Champac, A Gomez, F Forero, K Roy
VLSI-SoC: Design and Engineering of Electronics Systems Based on New …, 2019
32019
A metric-guided gate-sizing methodology for aging guardband reduction
AF Gomez, R Gomez, V Champac
2018 IEEE 19th Latin-American Test Symposium (LATS), 1-6, 2018
32018
Circuit performance optimization for local intra-die process variations using a gate selection metric
V Champac, AN Reyes, AF Gomez
2015 IFIP/IEEE International Conference on Very Large Scale Integration …, 2015
32015
Business interest associations in the USA and Europe: evaluation of digital marketing techniques applied on their websites and social networks
JM Ponzoa, A Gómez, R Arilla
Journal of Enterprising Communities: People and Places in the Global Economy, 2023
22023
Emotions in fear communication: A cross‐cultural neuromarketing approach
JM Mas, A Gómez, O Carrero
Psychology & Marketing 41 (4), 697-718, 2024
12024
Technologically empowered? perception and acceptance of AR glasses and 3D printers in new generations of consumers.
JMP Casado, A Gómez, S Villaverde, V Díaz
Technological Forecasting and Social Change 173 (1), 99, 2021
12021
Critical path selection under NBTI/PBTI aging for adaptive frequency tuning
AF Gomez, V Champac
2016 IEEE East-West Design & Test Symposium (EWDTS), 1-4, 2016
12016
A methodology for NBTI circuit reliability at reduced power consumption using dual supply voltage
F Forero, A Gomez, V Champac
2016 17th Latin-American Test Symposium (LATS), 81-86, 2016
12016
CULTURE, INSTITUTIONS AND DIGITAL REVOLUTION: MUSEUMS’RELEVANCE IN THE DIGITAL ECOSYSTEM.
A Gomez, R Fernandez-Hernandez, C Marin-Palacios
Transformations in Business & Economics 23 (1), 2024
2024
GO GREEN IN A GREENER WORLD: State of the Art in EU&LATAM.
A Gómez, J PONZOA, J MAS
Human Review 14 (2), 2022
2022
Go green in a greener world: State of the art in EU & Latin America
A Gómez, JM Ponza, JM Mas
CUICIID 2022: congreso Internacional sobre Comunicación, Innovación …, 2022
2022
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