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Emil Agócs
Emil Agócs
Physicist, Hungarian Academy of Sciences Centre for Energy Research
Dirección de correo verificada de energia.mta.hu - Página principal
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Simulation of radiation effects in AlGaN/GaN HEMTs
EE Patrick, M Choudhury, F Ren, SJ Pearton, ME Law
ECS Journal of Solid State Science and Technology 4 (3), Q21, 2015
412015
Approaches to calculate the dielectric function of ZnO around the band gap
E Agocs, B Fodor, B Pollakowski, B Beckhoff, A Nutsch, M Jank, P Petrik
Thin Solid Films 571, 684-688, 2014
302014
Target dependent femtosecond laser plasma implantation dynamics in enabling silica for high density erbium doping
J Chandrappan, M Murray, T Kakkar, P Petrik, E Agocs, Z Zolnai, ...
Scientific Reports 5 (1), 14037, 2015
282015
Porosity and thickness characterization of porous Si and oxidized porous Si layers–An ultraviolet–visible–mid infrared ellipsometry study
B Fodor, E Agocs, B Bardet, T Defforge, F Cayrel, D Alquier, M Fried, ...
microporous and mesoporous materials 227, 112-120, 2016
252016
Bilayered (silica–chitosan) coatings for studying dye release in aqueous media: The role of chitosan properties
M Dabóczi, E Albert, E Agócs, M Kabai-Faix, Z Hórvölgyi
Carbohydrate polymers 136, 137-145, 2016
232016
Spectroscopic ellipsometry of columnar porous Si thin films and Si nanowires
B Fodor, T Defforge, E Agócs, M Fried, G Gautier, P Petrik
Applied Surface Science 421, 397-404, 2017
222017
Highly transparent ITO thin films on photosensitive glass: sol–gel synthesis, structure, morphology and optical properties
L Kőrösi, S Papp, S Beke, B Pécz, R Horváth, P Petrik, E Agócs, I Dékány
Applied Physics A 107, 385-392, 2012
222012
Investigation of thin polymer layers for biosensor applications
A Saftics, E Agócs, B Fodor, D Patkó, P Petrik, K Kolari, T Aalto, P Fürjes, ...
Applied surface science 281, 66-72, 2013
212013
Protein adsorption monitored by plasmon-enhanced semi-cylindrical Kretschmann ellipsometry
B Kalas, J Nador, E Agocs, A Saftics, S Kurunczi, M Fried, P Petrik
Applied Surface Science 421, 585-592, 2017
202017
Plasmon-enhanced two-channel in situ Kretschmann ellipsometry of protein adsorption, cellular adhesion and polyelectrolyte deposition on titania nanostructures
J Nador, B Kalas, A Saftics, E Agocs, P Kozma, L Korosi, I Szekacs, ...
Optics Express 24 (5), 4812-4823, 2016
192016
Doping silica beyond limits with laser plasma for active photonic materials
J Chandrappan, M Murray, P Petrik, E Agocs, Z Zolnai, A Tempez, ...
Optical Materials Express 5 (12), 2849-2861, 2015
182015
Optical characterization of nanocrystals in silicon rich oxide superlattices and porous silicon
E Agocs, P Petrik, S Milita, L Vanzetti, S Gardelis, AG Nassiopoulou, ...
Thin Solid Films 519 (9), 3002-3005, 2011
172011
Micro-combinatorial sampling of the optical properties of hydrogenated amorphous for the entire range of compositions towards a database for …
B Kalas, Z Zolnai, G Sáfrán, M Serényi, E Agocs, T Lohner, A Nemeth, ...
Scientific reports 10 (1), 19266, 2020
162020
Optical properties of Zr and ZrO2
P Petrik, A Sulyok, T Novotny, E Perez-Feró, B Kalas, E Agocs, T Lohner, ...
Applied Surface Science 421, 744-747, 2017
152017
Scatterometry reference standards to improve tool matching and traceability in lithographical nanomanufacturing
E Agocs, B Bodermann, S Burger, G Dai, J Endres, PE Hansen, L Nielson, ...
Nanoengineering: Fabrication, Properties, Optics, and Devices XII 9556, 153-164, 2015
132015
Comparative measurements on atomic layer deposited Al2O3 thin films using ex situ table top and mapping ellipsometry, as well as X-ray and VUV reflectometry
P Petrik, T Gumprecht, A Nutsch, G Roeder, M Lemberger, G Juhasz, ...
Thin Solid Films 541, 131-135, 2013
122013
Optical characterization of macro-, micro-and nanostructures using polarized light
P Petrik, N Kumar, G Juhasz, C Major, B Fodor, E Agocs, T Lohner, ...
Journal of Physics: Conference Series 558 (1), 012008, 2014
112014
Spectroscopic ellipsometry studies on the optical constants of Bi4Ti3O12: xNa thin films grown by metal-organic chemical vapor deposition
SB Anooz, J Schwarzkopf, R Dirsyte, E Agocs, P Petrik, A Kwasniewski, ...
Thin Solid Films 519 (11), 3782-3788, 2011
112011
Spectroscopic ellipsometry studies on the optical constants of Bi4Ti3O12: xNa thin films grown by metal-organic chemical vapor deposition
SB Anooz, J Schwarzkopf, R Dirsyte, E Agocs, P Petrik, A Kwasniewski, ...
Thin Solid Films 519 (11), 3782-3788, 2011
112011
Atomic layer deposition and characterization of Zn-doped Ga2O3 films
Z Baji, I Cora, ZE Horváth, E Agócs, Z Szabó
Journal of Vacuum Science & Technology A 39 (3), 2021
102021
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Artículos 1–20