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Chetan S. Kulkarni
Chetan S. Kulkarni
Senior Scientist at NASA Ames Research Center (KBR, Inc)
Dirección de correo verificada de nasa.gov - Página principal
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Adaptation of an electrochemistry-based li-ion battery model to account for deterioration observed under randomized use
B Bole, CS Kulkarni, M Daigle
Annual conference of the prognostics and health management society, 2014
1392014
Prognostics Approach for Power MOSFET under Thermal-Stress Aging
J Celaya, A Saxena, CS Kulkarni, S Saha, K Goebel
Proceedings - Annual Reliability and Maintainability Symposium (RAMS), 2012, 1-6, 2012
1002012
Electrochemistry-based Battery Modeling for Prognostics
M Daigle, CS Kulkarni
Annual Conference of the Prognostics and Health Management Society 2013, 249-261, 2013
952013
A Model-based Prognostics Methodology for Electrolytic Capacitors Based on Electrical Overstress Accelerated Aging
JR Celaya, C Kulkarni, G Biswas, S Saha, K Goebel
Proceeding of Annual Conference of the Prognostics and Health Management …, 2011
88*2011
Randomized Battery Usage Data Set
C Kulkarni, M Brian Bole, Daigle
https://ti.arc.nasa.gov/dev/tech/dash/groups/pcoe/prognostic-data-repository …, 2014
69*2014
Integrated diagnostic/prognostic experimental setup for capacitor degradation and health monitoring
C Kulkarni, G Biswas, X Koutsoukos, J Celaya, K Goebel
IEEE AUTOTESTCON, 1-7, 2010
622010
Physics Based Electrolytic Capacitor Degradation Models for Prognostic Studies under Thermal Overstress
CS Kulkarni, JR Celaya, K Goebel, G Biswas
1st European Conference of the Prognostics and Health Management Society, 1-9, 2012
592012
A prognosis case study for electrolytic capacitor degradation in DC-DC converters
C Kulkarni, G Biswas, X Koutsoukos
Proceeding of Annual Conference of the Prognostics and Health Management …, 2009
572009
Fusing physics-based and deep learning models for prognostics
MA Chao, C Kulkarni, K Goebel, O Fink
Reliability Engineering & System Safety 217, 107961, 2022
472022
End-of-discharge and end-of-life prediction in lithium-ion batteries with electrochemistry-based aging models
M Daigle, CS Kulkarni
AIAA Infotech@ aerospace, 2132, 2016
432016
Physics of failure models for capacitor degradation in DC-DC converters
C Kulkarni, G Biswas, X Koutsoukos, K Goebel, J Celaya
The Maintenance and Reliability Conference, MARCON, 2010
412010
Accelerated Aging in Electrolytic Capacitors for Prognostics
J Celaya, C Kulkarni, S Saha, G Biswas, K Goebel
Proceedings Annual Reliability and Maintainability Symposium (RAMS), 2012, 1-6, 2012
382012
Battery health management for small-size rotary-wing electric unmanned aerial vehicles: An efficient approach for constrained computing platforms
G Sierra, M Orchard, K Goebel, C Kulkarni
Reliability Engineering & System Safety 182, 166-178, 2019
352019
Accelerated aging experiments for capacitor health monitoring and prognostics
CS Kulkarni, JR Celaya, G Biswas, K Goebel
2012 IEEE AUTOTESTCON Proceedings, 356-361, 2012
322012
Experimental studies of ageing in electrolytic capacitors
C Kulkarni, G Biswas, X Koutsoukos, J Celaya, K Goebel
Proceeding of Annual Conference of the Prognostics and Health Management Society, 2010
292010
Physics Based Degradation Models for Electrolytic Capacitor Prognostics under Thermal Overstress Conditions
CS Kulkarni, G Biswas, JR Celaya, K Goebel
International Journal of the PHM Society 4 (1), 13, 2013
272013
Aircraft engine run-to-failure dataset under real flight conditions for prognostics and diagnostics
M Arias Chao, C Kulkarni, K Goebel, O Fink
Data 6 (1), 5, 2021
252021
Towards A Model-Based Prognostics Methodology for Electrolytic Capacitors: A Case Study Based on Electrical Overstress Accelerated Aging
C Kulkarni, J Celaya, G Biswas, K Goebel
International Journal of Prognostics and Health Management 5 (1), 16, 2012
25*2012
Prognostics Health Management and Physics based failure Models for Electrolytic Capacitors
CS Kulkarni, JR Celaya, G Biswas, K Goebel
AIAA Infotech@Aerospace Conference 1, 1-7, 2012
21*2012
Prognostic Techniques for Capacitor Degradation and Health Monitoring
C Kulkarni, G Biswas, J Celaya, K Goebel
The Maintenance & Reliability Conference, MARCON 2011, 1-14, 2011
212011
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