| Automatic test program generation using executing-trace-based constraint extraction for embedded processors Y Zhang, H Li, X Li IEEE Transactions on Very Large Scale Integration (VLSI) Systems 21 (7 …, 2012 | 45 | 2012 |
| Software-based self-testing of processors using expanded instructions Y Zhang, H Li, X Li 2010 19th IEEE Asian Test Symposium, 415-420, 2010 | 29 | 2010 |
| Temperature-aware software-based self-testing for delay faults Y Zhang, Z Peng, J Jiang, H Li, M Fujita 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE), 423-428, 2015 | 27 | 2015 |
| Automatic test program generation for out-of-order superscalar processors Y Zhang, A Rezine, P Eles, Z Peng 2012 IEEE 21st Asian Test Symposium, 338-343, 2012 | 15 | 2012 |
| Codeword selection for crosstalk avoidance and error correction on interconnects Y Zhang, H Li, X Li, Y Hu 26th IEEE VLSI Test Symposium (vts 2008), 377-382, 2008 | 15 | 2008 |
| Software-based self-testing using bounded model checking for out-of-order superscalar processors Y Zhang, K Chakrabarty, Z Peng, A Rezine, H Li, P Eles, J Jiang IEEE Transactions on Computer-Aided Design of Integrated Circuits and …, 2019 | 14 | 2019 |
| A deterministic-path routing algorithm for tolerating many faults on wafer-level NoC Z Chen, Y Zhang, Z Peng, J Jiang 2019 Design, Automation & Test in Europe Conference & Exhibition (DATE …, 2019 | 12 | 2019 |
| Selected transition time adjustment for tolerating crosstalk effects on network-on-chip interconnects Y Zhang, H Li, Y Min, X Li IEEE transactions on very large scale integration (VLSI) systems 19 (10 …, 2010 | 11 | 2010 |
| Reliable network-on-chip router for crosstalk and soft error tolerance Y Zhang, H Li, X Li 2008 17th Asian Test Symposium, 438-443, 2008 | 11 | 2008 |
| Software-based online self-testing of network-on-chip using bounded model checking Y Zhang, K Chakrabarty, H Li, J Jiang 2017 IEEE International Test Conference (ITC), 1-10, 2017 | 9 | 2017 |
| Selected crosstalk avoidance code for reliable network-on-chip Y Zhang, HW Li, XW Li Journal of Computer Science and Technology 24 (6), 1074-1085, 2009 | 3 | 2009 |
| Thermal-aware SoC test scheduling with voltage/frequency scaling and test partition Y Zhang, L Ling, J Jiang, J Xiao Journal of Electronic Testing 34, 447-460, 2018 | 2 | 2018 |
