| Microscale deformation behavior of bicrystal boundaries in pure tin (Sn) using micropillar compression CS Kaira, SS Singh, A Kirubanandham, N Chawla Acta Materialia 120, 56-67, 2016 | 52 | 2016 |
| Microstructural evolution and deformation behavior of Al-Cu alloys: A Transmission X-ray Microscopy (TXM) and micropillar compression study CS Kaira, C Kantzos, JJ Williams, V De Andrade, F De Carlo, N Chawla Acta Materialia 144, 419-431, 2018 | 48 | 2018 |
| Automated correlative segmentation of large Transmission X-ray Microscopy (TXM) tomograms using deep learning CS Kaira, X Yang, V De Andrade, F De Carlo, W Scullin, D Gursoy, ... Materials Characterization 142, 203-210, 2018 | 41 | 2018 |
| 3D X-ray microtomography and mechanical characterization of corrosion-induced damage in 7075 aluminium (Al) alloys R Vallabhaneni, TJ Stannard, CS Kaira, N Chawla Corrosion Science 139, 97-113, 2018 | 35 | 2018 |
| Probing novel microstructural evolution mechanisms in aluminum alloys using 4D nanoscale characterization CS Kaira, V De Andrade, SS Singh, C Kantzos, A Kirubanandham, ... Advanced Materials 29 (41), 1703482, 2017 | 30 | 2017 |
| Exploring novel deformation mechanisms in aluminum–copper alloys using in situ 4D nanomechanical testing CS Kaira, TJ Stannard, V De Andrade, F De Carlo, N Chawla Acta Materialia 176, 242-249, 2019 | 27 | 2019 |
| Accurate stochastic reconstruction of heterogeneous microstructures by limited x‐ray tomographic projections H Li, S Kaira, J Mertens, N Chawla, Y Jiao Journal of microscopy 264 (3), 339-350, 2016 | 27 | 2016 |
| Mechanical properties of microconstituents in Nb-Si-Ti alloy by micropillar compression and nanoindentation E Guo, SS Singh, CS Kaira, X Meng, Y Xu, L Luo, M Wang, N Chawla Materials Science and Engineering: A 687, 99-106, 2017 | 21 | 2017 |
| Microstructure and mechanical properties of co-sputtered Al-SiC composites S Singh, S Chang, CS Kaira, JK Baldwin, N Mara, N Chawla Materials & Design 168, 107670, 2019 | 15 | 2019 |
| In situ tensile testing of tin (Sn) whiskers in a focused ion beam (FIB)/scanning electron microscope (SEM) R Vallabhaneni, E Izadi, CR Mayer, CS Kaira, SS Singh, J Rajagopalan, ... Microelectronics Reliability 79, 314-320, 2017 | 13 | 2017 |
| Microstructural quantification and property prediction using limited X-ray tomography data H Li, S Singh, C Shashank Kaira, JCE Mertens, JJ Williams, N Chawla, ... JOM 68, 2288-2295, 2016 | 11 | 2016 |
| In situ micropillar compression of Al/SiC nanolaminates using laboratory-based nanoscale X-ray microscopy: Effect of nanopores on mechanical behavior S Singh, CS Kaira, H Bale, C Huynh, A Merkle, N Chawla Materials Characterization 150, 207-212, 2019 | 10 | 2019 |
| Nanoscale three-dimensional microstructural characterization of an Sn-rich solder alloy using high-resolution transmission X-ray microscopy (TXM) CS Kaira, CR Mayer, V De Andrade, F De Carlo, N Chawla Microscopy and Microanalysis 22 (4), 808-813, 2016 | 10 | 2016 |
| Understanding Nanoscale 4D Microstructural Evolution in Aluminum Alloys using Transmission X-Ray Microscopy (TXM) CS Kaira, V De Andrade, SS Singh, C Kantzos, F De Carlo, N Chawla Microscopy and Microanalysis 23 (S1), 2220-2221, 2017 | 1 | 2017 |
| Structure-Property Relationships in Aluminum-Copper alloys using Transmission X-Ray Microscopy (TXM) and Micromechanical Testing CS Kaira Arizona State University, 2017 | 1 | 2017 |
| In situ nanomechanical testing of Al-SiC nanolaminates using 3D X-ray Microscopy S Kaira, S Singh | | |
| Probing 4D Microstructural Evolution in Aluminum alloys using Transmission X-Ray Microscopy (TXM) CS Kaira, V De Andrade, SS Singh, C Kantzos, F De Carlo, N Chawla | | |
Vincent De AndradeArgonne National LaboratoryDirección de correo verificada de anl.gov
