Seguir
Robert Coffie
Robert Coffie
President, RLC Solutions
Dirección de correo verificada de rlcsolutions.com
Título
Citado por
Citado por
Año
AlGaN/AlN/GaN high-power microwave HEMT
L Shen, S Heikman, B Moran, R Coffie, NQ Zhang, D Buttari, ...
IEEE Electron Device Letters 22 (10), 457-459, 2001
5952001
Metalorganic chemical vapor deposition of GaN on Si (111): Stress control and application to field-effect transistors
H Marchand, L Zhao, N Zhang, B Moran, R Coffie, UK Mishra, JS Speck, ...
journal of Applied Physics 89 (12), 7846-7851, 2001
2492001
Insulated gate e-mode transistors
CS Suh, I Ben-Yaacov, R Coffie, U Mishra
US Patent 7,851,825, 2010
2342010
Enhancement Mode III-N HEMTs
U Mishra, R Coffie, L Shen, I Ben-Yaacov, P Parikh
US Patent 8,519,438, 2013
2262013
Realization of wide electron slabs by polarization bulk doping in graded III–V nitride semiconductor alloys
D Jena, S Heikman, D Green, D Buttari, R Coffie, H Xing, S Keller, ...
Applied physics letters 81 (23), 4395-4397, 2002
2102002
12W/mm power density AlGaN/GaN HEMTs on sapphire substrate
A Chini, D Buttari, R Coffie, S Heikman, S Keller, UK Mishra
Electronics Letters 40 (1), 1, 2004
1932004
Gallium nitride based transistors
H Xing, S Keller, YF Wu, L McCarthy, IP Smorchkova, D Buttari, R Coffie, ...
Journal of Physics: Condensed Matter 13 (32), 7139, 2001
1712001
Semiconductor devices with field plates
R Chu, R Coffie
US Patent 8,390,000, 2013
1532013
High-power polarization-engineered GaN/AlGaN/GaN HEMTs without surface passivation
L Shen, R Coffie, D Buttari, S Heikman, A Chakraborty, A Chini, S Keller, ...
IEEE Electron Device Letters 25 (1), 7-9, 2004
1402004
Origin of etch delay time in dry etching of AlGaN/GaN structures
D Buttari, A Chini, T Palacios, R Coffie, L Shen, H Xing, S Heikman, ...
Applied physics letters 83 (23), 4779-4781, 2003
1292003
Power and linearity characteristics of field-plated recessed-gate AlGaN-GaN HEMTs
A Chini, D Buttari, R Coffie, L Shen, S Heikman, A Chakraborty, S Keller, ...
IEEE Electron Device Letters 25 (5), 229-231, 2004
1262004
Systematic characterization of Cl2 reactive ion etching for improved ohmics in AlGaN/GaN HEMTs
D Buttari, A Chini, G Meneghesso, E Zanoni, B Moran, S Heikman, ...
IEEE Electron device letters 23 (2), 76-78, 2002
892002
2.1 A/mm current density AlGaN/GaN HEMT
A Chini, R Coffie, G Meneghesso, E Zanoni, D Buttari, S Heikman, ...
Electronics letters 39 (7), 1, 2003
882003
High linearity and high efficiency of class-B power amplifiers in GaN HEMT technology
V Paidi, S Xie, R Coffie, B Moran, S Heikman, S Keller, A Chini, ...
IEEE Transactions on Microwave Theory and Techniques 51 (2), 643-652, 2003
822003
P-capped GaN-AlGaN-GaN high-electron mobility transistors (HEMTs)
R Coffie, D Buttari, S Heikman, S Keller, A Chini, L Shen, UK Mishra
IEEE Electron Device Letters 23 (10), 588-590, 2002
812002
High power semiconductor electronic components with increased reliability
RK Lal, R Coffie, Y Wu, P Parikh, Y Dora, U Mishra, S Chowdhury, ...
US Patent 8,598,937, 2013
802013
Mass transport regrowth of GaN for ohmic contacts to AlGaN/GaN
S Heikman, S Keller, B Moran, R Coffie, SP DenBaars, UK Mishra
physica status solidi (a) 188 (1), 355-358, 2001
712001
Systematic characterization of Cl2 reactive ion etching for gate recessing in AlGaN/GaN HEMTs
D Buttari, A Chini, G Meneghesso, E Zanoni, P Chavarkar, R Coffie, ...
IEEE Electron Device Letters 23 (3), 118-120, 2002
522002
Semiconductor electronic components and circuits
P Parikh, J Honea, CC Blake, R Coffie, Y Wu, U Mishra
US Patent 8,624,662, 2014
472014
Dual-gate AlGaN/GaN modulation-doped field-effect transistors with cut-off frequencies fT>60 GHz
CH Chen, R Coffie, K Krishnamurthy, S Keller, M Rodwell, UK Mishra
IEEE Electron Device Letters 21 (12), 549-551, 2000
452000
El sistema no puede realizar la operación en estos momentos. Inténtalo de nuevo más tarde.
Artículos 1–20