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Akane Agui
Akane Agui
JAEA
Verified email at spring8.or.jp
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Year
Electronic structure of carbon nitride thin films studied by X-ray spectroscopy techniques
N Hellgren, J Guo, Y Luo, C Såthe, A Agui, S Kashtanov, J Nordgren, ...
Thin Solid Films 471 (1-2), 19-34, 2005
1732005
X-ray spectroscopic studies of low dielectric constant parylene and fluorinated amorphous carbon films
Y Ma, H Yang, J Guo, C Sathe, A Agui, JE Nordgren
Applied Physics Letters 72, 1998
1641998
Structural and electronic properties of low dielectric constant fluorinated amorphous carbon films
Y Ma, H Yang, J Guo, C Sathe, A Agui, J Nordgren
Applied Physics Letters 72 (25), 3353-3355, 1998
1361998
Nitrogen bonding structure in carbon nitride thin films studied by soft x-ray spectroscopy
N Hellgren, J Guo, C Såthe, A Agui, J Nordgren, Y Luo, H Ågren, ...
Applied Physics Letters 79 (26), 4348-4350, 2001
1222001
First results from the actinide science beamline BL23SU at SPring-8
Y Saitoh, T Nakatani, T Matsushita, A Agui, A Yoshigoe, Y Teraoka, ...
Nuclear Instruments and Methods in Physics Research Section A: Accelerators …, 2001
1042001
Suppression of temperature hysteresis in negative thermal expansion compound BiNi1− xFexO3 and zero-thermal expansion composite
K Nabetani, Y Muramatsu, K Oka, K Nakano, H Hojo, M Mizumaki, A Agui, ...
Applied Physics Letters 106 (6), 2015
892015
Soft x‐ray emission spectrometer for undulator radiation
S Shin, A Agui, M Fujisawa, Y Tezuka, T Ishii, N Hirai
Review of scientific instruments 66 (2), 1584-1586, 1995
781995
Various valence states of square-coordinated mn in a-site-ordered perovskites
Y Long, T Saito, M Mizumaki, A Agui, Y Shimakawa
Journal of the American Chemical Society 131 (44), 16244-16247, 2009
752009
Resonant soft-x-ray emission study in relation to the band structure of cBN
A Agui, S Shin, M Fujisawa, Y Tezuka, T Ishii, Y Muramatsu, O Mishima, ...
Physical Review B 55 (4), 2073, 1997
661997
The electronic structure of polyaniline and doped phases studied by soft X-ray absorption and emission spectroscopies
M Magnuson, JH Guo, SM Butorin, A Agui, C Såthe, J Nordgren, ...
The Journal of chemical physics 111 (10), 4756-4761, 1999
621999
Varied line‐spacing plane grating monochromator for undulator beamline
M Fujisawa, A Harasawa, A Agui, M Watanabe, A Kakizaki, S Shin, T Ishii, ...
Review of scientific instruments 67 (2), 345-349, 1996
611996
Resonant soft X-ray emission study of rutile (TiO2)
Y Tezuka, S Shin, A Agui, M Fujisawa, T Ishii
Journal of the Physical Society of Japan 65 (1), 312-317, 1996
581996
Melting of Pb Charge Glass and Simultaneous Pb–Cr Charge Transfer in PbCrO3 as the Origin of Volume Collapse
R Yu, H Hojo, T Watanuki, M Mizumaki, T Mizokawa, K Oka, H Kim, ...
Journal of the American Chemical Society 137 (39), 12719-12728, 2015
532015
Electron holography: A maximum entropy reconstruction scheme
T Matsushita, A Yoshigoe, A Agui
Europhysics Letters 71 (4), 597, 2005
522005
Observation of resonant Raman scattering at the Si core exciton
S Shin, A Agui, M Watanabe, M Fujisawa, Y Tezuka, T Ishii
Physical Review B 53 (23), 15660, 1996
491996
Resonant soft x-ray Raman scattering of NiO
M Magnuson, SM Butorin, A Agui, J Nordgren
Journal of Physics: Condensed Matter 14 (13), 3669, 2002
482002
Intermetallic charge transfer and band gap of MTiO3 (M= Mn, Fe, Co, and Ni) studied by O 1s-edge X-ray emission spectroscopy
A Agui, M Mizumaki
Journal of Electron Spectroscopy and Related Phenomena 184 (8-10), 463-467, 2011
472011
A new approach for three-dimensional atomic-image reconstruction from a single-energy photoelectron hologram
T Matsushita, A Agui, A Yoshigoe
Europhysics Letters 65 (2), 207, 2004
462004
Oxygen K-edge X-ray absorption near edge structures (XANES) of sublimated films of amino acids
M Tanaka, K Nakagawa, T Koketsu, A Agui, A Yokoya
Journal of Synchrotron Radiation 8 (2), 1009-1011, 2001
422001
Electronic structure of single-wall carbon nanotubes studied by resonant inelastic X-ray scattering
S Eisebitt, A Karl, W Eberhardt, JE Fischer, C Sathe, A Agui, J Nordgren
Applied Physics-Section A-Materials Science and Processing 67 (1), 89-94, 1998
421998
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