Genetic algorithm-based test generation for software product line with the integration of fault localization techniques X Li, WE Wong, R Gao, L Hu, S Hosono Empirical Software Engineering 23, 1-51, 2018 | 41 | 2018 |
How does combinatorial testing perform in the real world: an empirical study L Hu, WE Wong, DR Kuhn, RN Kacker Empirical Software Engineering 25, 2661-2693, 2020 | 32 | 2020 |
A survey of the inadequacies in traffic sign recognition systems for autonomous vehicles AF Magnussen, N Le, L Hu, WE Wong International Journal of Performability Engineering 16 (10), 1588, 2020 | 19 | 2020 |
Improving MC/DC and fault detection strength using combinatorial testing D Li, L Hu, R Gao, WE Wong, DR Kuhn, RN Kacker 2017 IEEE International Conference on Software Quality, Reliability and …, 2017 | 18 | 2017 |
Effective test generation for combinatorial decision coverage R Gao, L Hu, WE Wong, HL Lu, SK Huang 2016 IEEE International Conference on Software Quality, Reliability and …, 2016 | 13 | 2016 |
CT-IoT: a combinatorial testing-based path selection framework for effective IoT testing L Hu, WE Wong, DR Kuhn, RN Kacker, S Li Empirical Software Engineering 27, 1-38, 2022 | 8 | 2022 |
Improving software testing education via industry sponsored contests WE Wong, L Hu, H Wang, Z Chen 2018 IEEE Frontiers in Education Conference (FIE), 1-5, 2018 | 7 | 2018 |
MCDC-Star: A white-box based automated test generation for high MC/DC coverage L Hu, WE Wong, DR Kuhn, R Kacker 2018 5th International Conference on Dependable Systems and Their …, 2018 | 5 | 2018 |
Software-testing contests: Observations and lessons learned X Wang, W Sun, L Hu, Y Zhao, WE Wong, Z Chen Computer 52 (10), 61-69, 2019 | 2 | 2019 |
Estimation of the Total Number of Software Failures from Test Data and Code Coverage: A Bayesian Approach HA Stieber, L Hu, WE Wong 2017 IEEE International Symposium on Software Reliability Engineering …, 2017 | 2 | 2017 |
Traditional Techniques for Software Fault Localization Y Li, L Hu, WE Wong, V Debroy, D Li Handbook of Software Fault Localization: Foundations and Advances, 119-133, 2023 | | 2023 |
On Combinatorial Design-based Test Generation L Hu | | 2021 |